Build orientation, surface roughness, and scan path influence on the microstructure, mechanical properties, and flexural fatigue behavior of Ti–6Al–4V fabricated by electron beam melting

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2020
Source ID
10.1016/j.msea.2019.138740

Entities

People

  • Andrew H. Chern
  • Chad E. Duty
  • Peeyush Nandwana
  • Peter K Liaw
  • Robert Mcdaniels
  • Robert Tryon
  • Ryan R. Dehoff

Organizations

  • United States Department of Energy
  • United States Navy

Tags

Technology Areas

  • Directed Energy
  • Microelectronics