Coulomb drag and counterflow Seebeck coefficient in bilayer-graphene double layers

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2017
Source ID
10.1016/j.nanoen.2017.07.035

Entities

People

  • D.b. Newell
  • J. Tian
  • Jinyin Hu
  • N.n. Klimov
  • Tony F. Wu
  • Y.p. Chen

Organizations

  • National Institute of Standards and Technology

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene