Determining the refractive index and the dielectric constant of PPDT2FBT thin film using spectroscopic ellipsometry

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2020
Source ID
10.1016/j.optmat.2020.110445

Entities

People

  • Alex Zakhidov
  • Chandan Howlader
  • Maggie Yihong Chen
  • Mehedhi Hasan

Organizations

  • National Science Foundation
  • Northrop Grumman
  • United States Navy