Measurement and modeling of the low-temperature penetration-depth anomaly in high-quality MgB2 thin films

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2012
Source ID
10.1016/j.physc.2012.04.034

Entities

People

  • B.h. Moeckly
  • D.E. Oates
  • Y.d. Agassi

Organizations

  • Office of Naval Research