Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 01, 2019
Source ID
10.1016/j.scriptamat.2018.11.030

Entities

People

  • Johan Hoefnagels
  • Marc De Graef
  • Tijmen Vermeij

Organizations

  • Office of Naval Research

Tags

Technology Areas

  • Microelectronics