Influence of ultra-low ethylene partial pressure on microstructural and compositional evolution of sputter-deposited Zr-C thin films

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2020
Source ID
10.1016/j.surfcoat.2020.126053

Entities

People

  • Angel Aleman
  • Chao Li
  • Hicham Zaid
  • Joshua Fankhauser
  • Kōichi Tanaka
  • Mark S. Goorsky
  • Pascal Berger
  • Suneel Kodambaka
  • Tyson Back

Organizations

  • Air Force Office of Scientific Research