Free-charge carrier profile of iso- and aniso-type Si homojunctions determined by terahertz and mid-infrared ellipsometry

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 01, 2011
Source ID
10.1016/j.tsf.2010.11.092

Entities

People

  • A. Boosalis
  • J. Šik
  • Mathias Schubert
  • T. Hofmann

Organizations

  • Army Research Office
  • National Science Foundation
  • University of Nebraska–Lincoln