Substrate and annealing temperature dependent electrical resistivity of sputtered titanium nitride thin films
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 01, 2018
- Source ID
- 10.1016/j.tsf.2018.07.001
Entities
People
- B.t. Kearney
- Battogtokh Jugdersuren
- J.c. Culbertson
- P.a. Desario
- Xiao Liu
Organizations
- Office of Naval Research