Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2016
Source ID
10.1016/j.ultramic.2016.07.002

Entities

People

  • Aaron C. Johnston-peck
  • Alan D. Roberts
  • Andrew A. Herzing
  • Joseph S. Duchene
  • Wei David Wei

Organizations

  • Air Force Office of Scientific Research
  • National Science Foundation

Tags

Technology Areas

  • Microelectronics