A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2018
Source ID
10.1016/j.ultramic.2018.03.004

Entities

People

  • J.m. Lebeau
  • Weizong Xu

Organizations

  • Air Force Office of Scientific Research
  • National Science Foundation

Tags

Technology Areas

  • AI & ML
  • AI & ML - Neural Networks
  • Microelectronics
  • Microelectronics - Graphene
  • Microelectronics - Microelectromechanical Systems