The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jul 01, 2020
- Source ID
- 10.1016/j.ultramic.2020.112994
Entities
People
- Darrell G. Schlom
- David A. Muller
- Elliot Padgett
- Eric Langenberg
- Megan E. Holtz
- Paul Cueva
- Yu-tsun Shao
Organizations
- Air Force Office of Scientific Research
- National Science Foundation
- United States Department of Energy