Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited)

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1016/j.vlsi.2017.08.009

Entities

People

  • Chase Cook
  • Hussam Amrouch
  • Jorg Henkel
  • Sheldon X.-D. Tan
  • Taeyoung Kim
  • Zeyu Sun

Organizations

  • Defense Advanced Research Projects Agency
  • German Research Foundation
  • National Science Foundation