A Three-Dimensional Reconstruction Algorithm for Scanning Transmission Electron Microscopy Data from a Single Sample Orientation

Abstract

Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data. We apply the approach to a lead iridate, PbIrO, and yttrium-stabilized zirconia, YZrO, heterostructure from data acquired with the specimen in a single plan-view orientation, with the epitaxial layers stacked along the beam direction. We demonstrate that Pb–Ir atomic columns are visible in the uppermost layers of the reconstructed volume. We compare this approach to the alternative techniques of depth sectioning using differential phase contrast scanning transmission electron microscopy (DPC-STEM) and multislice ptychographic reconstruction.

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2022
Source ID
10.1017/s1431927622012090

Entities

People

  • Christoph T Koch
  • Colin Ophus
  • Evan Sheridan
  • H. G. Brown
  • Jim Ciston
  • Katherine Inzani
  • Leslie J. Allen
  • Marcel Schloz
  • Mary C. Scott
  • Philipp M. Pelz
  • Ramamoorthy Ramesh
  • Scott D. Findlay
  • Shang-Lin Hsu
  • Sinéad M. Griffin
  • Thomas C. Pekin
  • Zimeng Zhang

Organizations

  • Air Force Office of Scientific Research
  • Australian Research Council
  • German Research Foundation
  • Humboldt-Universität zu Berlin
  • King's College London
  • Lawrence Berkeley National Laboratory
  • Monash University
  • United States Department of Energy
  • University of California
  • University of Melbourne

Tags

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Powder metallurgy of Titanium alloys.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.

Technology Areas

  • Microelectronics