Probing Crystallization Effects when Processing Bulk-Heterojunction Active Layers: Comparing Fullerene and Nonfullerene Acceptors

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 04, 2021
Source ID
10.1021/acs.chemmater.0c03971

Entities

People

  • Austin L. Jones
  • Ian Pelse
  • John R Reynolds
  • Lee J. Richter

Organizations

  • Georgia Tech
  • National Institute of Standards and Technology
  • Office of Naval Research
  • United States Department of Defense