Surface Oxidation of Bi2(Te,Se)3 Topological Insulators Depends on Cleavage Accuracy
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Dec 21, 2015
- Source ID
- 10.1021/acs.chemmater.5b03923
Entities
People
- Conor R. Thomas
- Hikmet Sezen
- Jeffrey Schwartz
- Matthew G. Frith
- Matthew K. Vallon
- Robert Cava
- Satya K. Kushwaha
- Steven L. Bernasek
Organizations
- Army Research Office
- Division of Chemistry
- Princeton University