Near-Surface Composition, Structure, and Energetics of TiO2 Thin Films: Characterization of Stress-Induced Defect States in Oxides Prepared via Chemical Vapor Deposition versus Solution Deposition from Sol–Gel Precursors
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Oct 22, 2021
- Source ID
- 10.1021/acs.jpcc.1c05477
Entities
People
- Neal R. Armstrong
- R Clayton Shallcross
Organizations
- Arizona Board of Regents
- Division of Materials Research
- Office of Naval Research
- University of Arizona