Thickness-Dependent Raman Scattering from Thin-Film Systems

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 03, 2023
Source ID
10.1021/acs.jpcc.2c06353

Entities

People

  • Hamidreza Zobeiri
  • Nathan Van Velson
  • Xinwei Wang

Organizations

  • Division of Chemical, Bioengineering, Environmental, and Transport Systems
  • Iowa State University
  • United States Department of Defense