Sensor Effect in Oxide Films with a Large Concentration of Conduction Electrons
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Mar 21, 2017
- Source ID
- 10.1021/acs.jpcc.6b10956
Entities
People
- Ivan I Oleynik
- L. I. Trakhtenberg
- M. A. Kozhushner
- M. I. Ikim
- T. V. Belysheva
- V. L. Bodneva
Organizations
- Defense Threat Reduction Agency
- Division of Civil, Mechanical & Manufacturing Innovation
- Moscow Institute of Physics and Technology
- Russian Center for Science Information
- Semenov Institute of Chemical Physics
- University of South Florida