Strong Interfacial Charge Trapping in Ultrathin SrRuO3 on SrTiO3 Probed by Noise Spectroscopy

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 15, 2022
Source ID
10.1021/acs.jpclett.2c01163

Entities

People

  • Chang-Beom Eom
  • Hwan Sik Kim
  • Hyungwoo Lee
  • Jaeyoung Jeon
  • Jiyeong Kim
  • Jung-Woo Lee
  • Kitae Eom
  • Sungkyu Kim
  • Yeong Hwan Ahn
  • Young Chul Kim

Organizations

  • Ajou University
  • Gordon and Betty Moore Foundation
  • Ministry of Science and ICT
  • Sejong University
  • United States Department of Defense
  • University of Wisconsin–Madison
  • Yonsei University