Interfacial States Cause Equal Decay of Plasmons and Hot Electrons at Gold–Metal Oxide Interfaces

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 27, 2020
Source ID
10.1021/acs.nanolett.0c00223

Entities

People

  • Benjamin Foerster
  • Carsten Sönnichsen
  • Martin Aeschlimann
  • Michael Hartelt
  • Sean S. E. Collins
  • Stephan Link

Organizations

  • Air Force Office of Scientific Research
  • German Research Foundation
  • Johannes Gutenberg University Mainz
  • Rice University
  • Robert A. Welch Foundation
  • University of Kaiserslautern

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene