Differentiation of Surface and Bulk Conductivities in Topological Insulators via Four-Probe Spectroscopy

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 10, 2016
Source ID
10.1021/acs.nanolett.5b04425

Entities

People

  • An-Ping Li
  • Chuanxu Ma
  • Corentin Durand
  • Helin Cao
  • Ireneusz Miotkowski
  • Michael A McGuire
  • Saban M. Hus
  • X.-g. Zhang
  • Xu Yang
  • Yong P. Chen

Organizations

  • Defense Advanced Research Projects Agency
  • Oak Ridge National Laboratory
  • Office of Basic Energy Sciences
  • Office of Science
  • Purdue University
  • University of Florida

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene