Three-Dimensional Integrated X-ray Diffraction Imaging of a Native Strain in Multi-Layered WSe2

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 16, 2018
Source ID
10.1021/acs.nanolett.7b05441

Entities

People

  • Andrew J Arnold
  • Daniel S. Schulman
  • Henry Chan
  • Jorg Maser
  • Kiran Sasikumar
  • Mathew J Cherukara
  • Ross J. Harder
  • Saptarshi Das
  • Sridhar Sadasivam
  • Subramanian K R S Sankaranarayanan
  • Wonsuk Cha

Organizations

  • Air Force Office of Scientific Research
  • Division of Electrical, Communications & Cyber Systems
  • Semiconductor Research Corporation