In Situ Radiation Hardness Study of Amorphous Zn–In–Sn–O Thin-Film Transistors with Structural Plasticity and Defect Tolerance

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 05, 2023
Source ID
10.1021/acsami.3c06555

Entities

People

  • Antonio Facchetti
  • Byungkyu Park
  • Choongik Kim
  • Dongil Ho
  • Hyunwoo Kang
  • Minh Nhut Le
  • Myung-Gil Kim
  • Sung Kyu Park
  • Sunwoo Choi

Organizations

  • Air Force Office of Scientific Research
  • Chung-Ang University
  • Ministry of Trade, Industry and Energy
  • National Research Foundation of Korea
  • Northwestern University
  • School of Materials, University of Manchester
  • Sogang University
  • Sungkyunkwan University