Modulated Degradation of Transient Electronic Devices through Multilayer Silk Fibroin Pockets

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2015
Source ID
10.1021/acsami.5b06059

Entities

People

  • David L. Kaplan
  • Fiorenzo G Omenetto
  • Hu Tao
  • Huanyu Cheng
  • John A. Rogers
  • Mark A. Brenckle
  • Mark Paquette
  • Sukwon Hwang
  • Yonggang Huang

Organizations

  • Air Force Office of Scientific Research
  • Division of Materials Research
  • Korea University
  • Northwestern University
  • Tufts University
  • University of Illinois Urbana–Champaign
  • University of Texas at Austin

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene