Measurement of Lateral and Interfacial Thermal Conductivity of Single- and Bilayer MoS2 and MoSe2 Using Refined Optothermal Raman Technique

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 10, 2015
Source ID
10.1021/acsami.5b08580

Entities

People

  • Daniel Chenet
  • Dezheng Sun
  • Gwan-Hyoung Lee
  • James C. Hone
  • Tony Heinz
  • Xian Zhang
  • Xu Cui
  • Yilei Li
  • Yumeng You

Organizations

  • Air Force Office of Scientific Research
  • National Research Foundation of Korea
  • Stanford University
  • Yonsei University