Effects of Stiff Film Pattern Geometry on Surface Buckling Instabilities of Elastic Bilayers

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 29, 2018
Source ID
10.1021/acsami.8b04916

Entities

People

  • Jiawei Yang
  • Ryan C Hayward
  • Tetsu Ouchi
  • Zhigang Suo

Organizations

  • Defense Threat Reduction Agency
  • Division of Materials Research
  • Harvard University
  • University of Massachusetts Amherst