Assessing Substitution Effects on Surface Chemistry by in Situ Ambient Pressure X-ray Photoelectron Spectroscopy on Perovskite Thin Films, BaCexZr0.9–xY0.1O2.95 (x = 0; 0.2; 0.9)

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 03, 2018
Source ID
10.1021/acsami.8b12546

Entities

People

  • Aaron Geller
  • Angelique Jarry
  • Bryan W Eichhorn
  • Christopher Pellegrinelli
  • David M Stewart
  • Eric D Wachsman
  • Ethan J. Crumlin
  • Ichiro Takeuchi
  • Sandrine Ricote
  • Xiaohang Zhang

Organizations

  • Colorado School of Mines
  • Lawrence Berkeley National Laboratory
  • Office of Naval Research

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene