Toward a Unified Theory Correlating Electronic, Thermodynamic, and Mechanical Properties at Defective Al/SiO2 Nanodevice Interfaces: An Application to Dielectric Breakdown
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Oct 10, 2019
- Source ID
- 10.1021/acsanm.9b01281
Entities
People
- Celine Hin
- Fei Lin
- Jianqiu Huang
Organizations
- Air Force Office of Scientific Research