Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 16, 2016
Source ID
10.1021/acscombsci.6b00142

Entities

People

  • Efrain Hernandez-rivera
  • Mark Tschopp
  • Shawn P Coleman

Organizations

  • United States Army Research Laboratory
  • United States Department of Energy