Measurement of Cohesion and Adhesion of Semiconducting Polymers by Scratch Testing: Effect of Side-Chain Length and Degree of Polymerization

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2018
Source ID
10.1021/acsmacrolett.8b00412

Entities

People

  • Cody W Carpenter
  • Daniel Rodriquez
  • Darren J. Lipomi
  • Grégory Favaro
  • James G. Kohl
  • Julian Ramírez
  • Kyle Burrows
  • Martin J. Heeney
  • Mohammad A. Alkhadra
  • Pierre Boufflet
  • Pierre Morel
  • Samuel E. Root
  • Zhuping Fei

Organizations

  • Air Force Office of Scientific Research
  • Division of Graduate Education
  • Imperial College London
  • Tritec engine
  • University of California, San Diego
  • University of San Diego