Thickness Trends of Electron and Hole Conduction and Contact Carrier Injection in Surface Charge Transfer Doped 2D Field Effect Transistors
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Oct 07, 2020
- Source ID
- 10.1021/acsnano.0c05572
Entities
People
- Andrew J Arnold
- Daniel S. Schulman
- Saptarshi Das
Organizations
- Air Force Office of Scientific Research
- Pennsylvania State University