Measuring and Then Eliminating Twin Domains in SnSe Thin Films Using Fast Optical Metrology and Molecular Beam Epitaxy

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 16, 2022
Source ID
10.1021/acsnano.2c02459

Entities

People

  • Derrick Liu
  • Kevin Ye
  • Maria Hilse
  • Nitin Samarth
  • Qian Song
  • R Jaramillo
  • Seong Soon Jo
  • Wouter Mortelmans

Organizations

  • Division of Materials Research
  • Massachusetts Institute of Technology
  • Office of Naval Research
  • Pennsylvania State University