Direct Evidence of the Pitch Angle Scattering of Relativistic Electrons Induced by EMIC Waves
Abstract
In this study, we analyze an electromagnetic ion cyclotron (EMIC) wave event of rising tone elements recorded by the Van Allen Probes. The pitch angle distributions of relativistic electrons exhibit a direct response to the two elements of EMIC waves: at the intermediate pitch angle, the fluxes are lower; and at the low pitch angle, the fluxes are higher than those when no EMIC was observed. In particular, the observed changes in the pitch angle distributions are most likely to be caused by nonlinear wave‐particle interaction. The calculation of the minimum resonant energy and a test‐particle simulation based on the observed EMIC waves support the role of the nonlinear wave‐particle interaction in the pitch angle scattering. This study provides direct evidence for the nonlinear pitch angle scattering of electrons by EMIC waves.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Feb 11, 2020
- Source ID
- 10.1029/2019gl085637
Entities
People
- Hui Zhu
- Liheng Zheng
- Lunjin Chen
- Seth G Claudepierre
Organizations
- Air Force Office of Scientific Research
- National Aeronautics and Space Administration
- National Science Foundation
- The Aerospace Corporation
- University of Texas at Dallas