Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations
Abstract
During cyclic loading, localization of intragranular deformation due to crystallographic slip acts as a precursor for crack initiation, often at coherent twin boundaries. A suite of high-resolution synchrotron X-ray characterizations, coupled with a crystal plasticity simulation, was conducted on a polycrystalline nickel-based superalloy microstructure near a parent-twin boundary in order to understand the deformation localization behavior of this critical, 3D microstructural configuration. Dark-field X-ray microscopy was spatially linked to high energy X-ray diffraction microscopy and X-ray diffraction contrast tomography in order to quantify, with cutting-edge resolution, an intragranular misorientation and high elastic strain gradients near a twin boundary. These observations quantify the extreme sub-grain scale stress gradients present in polycrystalline microstructures, which often lead to fatigue failure.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jun 24, 2020
- Source ID
- 10.1038/s41467-020-16894-2
Entities
People
- Can Yıldırım
- Carsten Detlefs
- Darren C Pagan
- Diwakar Naragani
- Michael D Sangid
- Paul A. Shade
- Phil Cook
- Sven Gustafson
- Wolfgang Ludwig
Organizations
- National Science Foundation
- United States Department of Defense