Dielectric screening in perovskite photovoltaics
Abstract
The performance of perovskite photovoltaics is fundamentally impeded by the presence of undesirable defects that contribute to non-radiative losses within the devices. Although mitigating these losses has been extensively reported by numerous passivation strategies, a detailed understanding of loss origins within the devices remains elusive. Here, we demonstrate that the defect capturing probability estimated by the capture cross-section is decreased by varying the dielectric response, producing the dielectric screening effect in the perovskite. The resulting perovskites also show reduced surface recombination and a weaker electron-phonon coupling. All of these boost the power conversion efficiency to 22.3% for an inverted perovskite photovoltaic device with a high open-circuit voltage of 1.25 V and a low voltage deficit of 0.37 V (a bandgap ~1.62 eV). Our results provide not only an in-depth understanding of the carrier capture processes in perovskites, but also a promising pathway for realizing highly efficient devices via dielectric regulation.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Apr 30, 2021
- Source ID
- 10.1038/s41467-021-22783-z
Entities
People
- Deying Luo
- Hongyu Yu
- Jiang Wu
- Qihuang Gong
- Qin Hu
- Rui Su
- Rui Zhu
- Ruopeng Zhang
- Thomas Paul Russell
- Wei Zhang
- Wenqiang Yang
- Xiaoyu Yang
- Zhaojian Xu
Organizations
- China Postdoctoral Science Foundation
- Engineering and Physical Sciences Research Council
- Guangdong Science and Technology Department
- National Natural Science Foundation of China
- Office of Basic Energy Sciences
- Office of Naval Research