Variability and origins of grain boundary electric potential detected by electron holography and atom-probe tomography

Document Details

Document Type
Pub Defense Publication
Publication Date
Apr 13, 2020
Source ID
10.1038/s41563-020-0656-1

Entities

People

  • Charudatta Phatak
  • Dieter Isheim
  • Jie Wang
  • Sossina M. Haile
  • Vinayak P. Dravid
  • Xin Xu
  • Yuzi Liu

Organizations

  • Division of Electrical, Communications & Cyber Systems
  • Division of Materials Research
  • National Science Foundation Directorate for Mathematical & Physical Sciences
  • Office of Basic Energy Sciences
  • Office of Naval Research

Tags

Technology Areas

  • Microelectronics