High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires
Abstract
Existing nanowire electrical characterization tools not only are expensive and require sophisticated facilities, but are far too slow to enable statistical characterization of highly variable samples.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2016
- Source ID
- 10.1039/c6lc00217j
Entities
People
- An-Ping Li
- Cevat Akin
- Corentin Durand
- Ho Yee Hui
- Jerry W Shan
- Jingang Yi
- L. C. Feldman
- Michael A Filler
- Saban M. Hus
Organizations
- Center for Nanophase Materials Sciences
- Defense Threat Reduction Agency
- Division of Chemical, Bioengineering, Environmental, and Transport Systems
- Georgia Tech
- Oak Ridge National Laboratory
- Office of Basic Energy Sciences
- Rutgers University
- United States Army