Rapid, molecule-free, in situ rare earth element abundances by SIMS-SSAMS
Abstract
We present a novel method for rapid and high-sensitivity in situ measurements of the rare earth elements (REEs) by combined secondary ion mass spectrometry and single-stage accelerator mass spectrometry (SIMS-SSAMS).
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2017
- Source ID
- 10.1039/c7ja00294g
Entities
People
- Albert J. Fahey
- Evan E Groopman
- Kenneth S. Grabowski
- Levke Kööp
Organizations
- Corning Inc.
- Office of Naval Research
- United States Army
- United States Naval Research Laboratory
- University of Chicago
- Washington University in St. Louis