A comprehensive study on the structural evolution of HfO2thin films doped with various dopants
Abstract
Quantitative phase analysis is first performed on doped Hafnia films to elucidate the structural origin of unexpected ferroelectricity.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2017
- Source ID
- 10.1039/c7tc01200d
Entities
People
- C. Richter
- Chong Zhou
- Chris M Fancher
- E. D. Grimley
- J. M. Lebeau
- Jacob L. Jones
- Min Hyuk Park
- T. Schenk
- Thomas Mikolajick
- Uwe Schroeder
Organizations
- Army Research Office
- Dynamo Dresden
- German Research Foundation
- National Science Foundation
- North Carolina State University
- Oak Ridge National Laboratory
- Technische Universität Dresden
- United States Army