Standalone interferometry-based calibration of convex lens-induced confinement microscopy with nanoscale accuracy

Abstract

Interferometry-based measurement of gap height in convex lens-induced confinement significantly improves accuracy at sub-100 nm gap thickness.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2019
Source ID
10.1039/c8an02300j

Entities

People

  • Daniel F Kienle
  • Daniel K. Schwartz
  • Gregory T. Morrin

Organizations

  • Defense Threat Reduction Agency
  • National Institute of Standards and Technology
  • National Institutes of Health
  • Office of Basic Energy Sciences
  • United States Army
  • University of Colorado Boulder

Tags

Fields of Study

  • Physics

Readers

  • Astronomy and Astrophysics.
  • Computational Modeling and Simulation
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.