Fingerprints of native defects in monolayer PbTe

Abstract

Understanding the intricate interplay of defects and electron–electron interactions is crucial to exploiting the full potential of materials for practical applications.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2019
Source ID
10.1039/c8na00125a

Entities

People

  • Chinedu Ekuma

Organizations

  • United States Army Research Laboratory

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene