Radiation damage during in situ electron microscopy of DNA-mediated nanoparticle assemblies in solution

Abstract

In situ electron microscopy in liquids is used to establish radiation damage pathways and damage-free imaging conditions for superlattices of oligonucleotide–nanoparticle conjugates, paving the way for imaging the self-assembly of such programmable atom equivalents in aqueous solution.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1039/c8nr04087g

Entities

People

  • Bo Zhang
  • Eli Sutter
  • Peter Sutter

Organizations

  • Army Research Office
  • Nebraska Public Power District
  • United States Army
  • United States Army Research Laboratory
  • University of Nebraska–Lincoln

Tags

Fields of Study

  • Physics

Readers

  • Nanocomposite Materials Science
  • Nanoscale Plasmonic Nanotechnology
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Biotechnology
  • Microelectronics
  • Microelectronics - Graphene