Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering
Abstract
The complementary methods of MicroED and GIWAXS provide insight into crystal structure arrangement in organic semiconductor thin films.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2020
- Source ID
- 10.1039/d0cc00119h
Entities
People
- Adam B Braunschweig
- Andrew M Levine
- Brent Nannenga
- Esther H. R. Tsai
- Guanhong Bu
- Sankarsan Biswas
Organizations
- Air Force Office of Scientific Research
- Arizona State University
- Brookhaven National Laboratory
- CUNY Graduate School and University Center
- Center for Functional Nanomaterials
- City University of New York
- National Science Foundation
- United States Army