Insights into dynamic sliding contacts from conductive atomic force microscopy
Abstract
Measuring the electrical conductivity serves as a proxy for characterizing the nanoscale contact. In this work, the correlation between sliding dynamics and current transport at single asperity sliding contact is investigated.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2020
- Source ID
- 10.1039/d0na00414f
Entities
People
- Ashlie Martini
- Mohammad R Vazirisereshk
- Nicholas Chan
- Philip Egberts
Organizations
- Air Force Office of Scientific Research
- Canada Foundation for Innovation
- National Science Foundation
- Natural Sciences and Engineering Research Council
- United States Army
- University of Calgary
- University of California