Directly measuring the structural transition pathways of strain-engineered VO2 thin films
Abstract
The interplay between epitaxial strains and structural transition pathways as well as local environment along the metal-to-insulator transition in VO2/MgF2 (001) and (110) thin films is investigated.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2020
- Source ID
- 10.1039/d0nr04776g
Entities
People
- Christopher N Singh
- Darrell G. Schlom
- David J. Gosztola
- Egor Evlyukhin
- Galo J Paez
- Hanjong Paik
- Louis Piper
- Sebastian A Howard
- Wei-Cheng Lee
Organizations
- Air Force Office of Scientific Research
- Argonne National Laboratory
- Binghamton University
- Center for Nanoscale Materials
- Cornell University
- National Science Foundation
- Secretariat of Higher Education, Science, Technology and Innovation
- United States Army
- United States Department of Energy