Resistance state evolution under constant electric stress on a MoS2 non-volatile resistive switching device
Abstract
Constant voltage and current stress were applied on MoS2 resistive switching devices, showing unique behaviors explained by a modified conductive-bridge-like model.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2020
- Source ID
- 10.1039/d0ra05209d
Entities
People
- Deji Akinwande
- Jack C. Lee
- James D. Austin
- Ruijing Ge
- Xiaohan Wu
- Yifu Huang
Organizations
- Army Research Office
- National Science Foundation
- United States Army
- University of Texas at Austin