Effect of photon counting shot noise on total internal reflection microscopy
Abstract
Total internal reflection microscopy (TIRM) measures changes in the distance between a colloidal particle and a transparent substrate by measuring the scattering intensity of the particle illuminated by an evanescent wave.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2022
- Source ID
- 10.1039/d1sm01587g
Entities
People
- David J. Pine
- Fan Cui
Organizations
- Army Research Office
- New York University
- United States Department of Energy