Revealing temperature-dependent polymer aggregation in solution with small-angle X-ray scattering

Abstract

Small-angle X-ray scattering is used to probe the solution behavior of two similar electron donor polymers. Differences in aggregate crystallinity are observed upon cooling for the two polymers which is then correlated with the film morphology.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2022
Source ID
10.1039/d1ta09086k

Entities

People

  • Enrique D. Gomez
  • Hongping Yan
  • I. Alperen Ayhan
  • John R Reynolds
  • Maged Abdelsamie
  • Michael F. Toney
  • Sebastian A. Schneider
  • Thomas P. Chaney

Organizations

  • Georgia Tech
  • Lawrence Berkeley National Laboratory
  • Office of Naval Research
  • Pennsylvania State University
  • SLAC National Accelerator Laboratory
  • Stanford University
  • United States Department of Energy
  • University of Colorado

Tags

Readers

  • Materials Science and Engineering.
  • Polymer Science and Technology

Technology Areas

  • Microelectronics