Enabling quantitative analysis of complex polymer blends by infrared nanospectroscopy and isotopic deuteration
Abstract
Atomic-force microscopy coupled with infrared spectroscopy (AFM-IR) deciphers surface morphology of thin-film polymer blends and composites by simultaneously mapping physical topography and chemical composition.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2023
- Source ID
- 10.1039/d3nr00886j
Entities
People
- Camille Cardinal
- Changwoo Do
- Kunlun Hong
- Nathaniel Prine
- Sarah E Morgan
- Song Zhang
- Tianyu Li
- Travis L. Thornell
- Xiaodan Gu
- Zhiqiang Cao
Organizations
- Engineer Research and Development Center
- Oak Ridge National Laboratory
- University of Southern Mississippi
- University of Tennessee