Absorption tail and fundamental absorption edge in vanadium phosphate glasses

Abstract

Optical measurements of the fundamental absorption edge and broad absorption tail of 50 mole% V2O5 vanadium phosphate glass films were made in the range 3850–30 000 cm−1 (2.6–0.33 μ) before and after reducing and oxidizing anneals. The absorption in the tail region of the fundamental absorption increased during reducing anneals and decreased during oxidizing anneals. A band at 19400 cm−1 (2.41 eV) was introduced by the reducing anneals. The band gap Eg was determined to be 2.71, 2.92, and 2.82 eV after successive anneals in oxygen, hydrogen, and oxygen, respectively. Evidence for direct forbidden transitions was observed from fundamental absorption edge measurements similar to that for crystalline V2O5. The concentration of reduced V4+ ions is concluded to be largely responsible for the variation of Eg and of the absorption tail.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 1973
Source ID
10.1063/1.1661895

Entities

People

  • Gordon Wood Anderson

Organizations

  • United States Naval Research Laboratory

Tags

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.